Surface Roughness Parameters

Surface Roughness Parameters

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  Precision is ourbusiness. Roughness measuring systems from Hommel-Etamic – Surface texture parameters in practice
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  2 Surface texture isvery important where it has a direct influence on the quality of the part. Therefore, it has to be defined as precisely as possible with the help of standardized surface texture parameters. This leaflet gives you an overview of the most important definitions, standards, and parameters of surface texture measurement. Hommel-Etamic manufactures a wide range of roughness measuring systems providing a large variety of evaluation possibilities – in the measuring lab as well as on the production line. One particularly important aspect is the continuous monitoring of the roughness measuring systems for optimum accuracy. Our DAkkS-DKD calibration laboratory can calibrate your standards based on different surface texture parameters. For parameters not requiring accreditation, we offer an in-house calibration certificate. . Surface texture measurement Surface texture measurement with Hommel-Etamic Division of a surface Unfiltered P-profile Filtered W-profile Filtered R-profile
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  3 The traverse length(lt) is the total length of the probe movement during the scanning process. It must be greater than the evaluation length ln in order to be able to form the roughness profile with the profile filter. With the exception of Rt and Rmr(c), the roughness parameters are defined within an evaluation length ln, which is determined using an average of five sampling lengths lr. The sampling length lr corresponds to the cut-off λc. Surface texture measurement Surface profile is measured two-dimensionally using the tracing system. The unfiltered primary profile (P-profile) is the actual measured surface profile. Filtering it in accordance with ISO 11562 produces the waviness profile (W-profile) and the roughness profile (R-profile). The variable for determining the limit between waviness and roughness is the cut-off λc. Following ISO 4287, all parameter definitions are valid for both the roughness profile as well as for the primary and waviness profiles. The profile type is identified by the capital letters P, R or W. The total height Pt, Wt or Rt of the respective profile type is the maxi- mum height between the highest peak and the deepest valley of the evaluation length profile. . Start-up length Roughness profile Run-off length Evaluation lengths – cut-off Surface profiles – total height of the profile
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  4 Selection of thecut-off (profile filter) accordin The cut-off is selected depending on the workpiece surface either accor- ding to the valley spacing, or the expected roughness values. At the same time the total evaluation length and the corresponding traverse Application example In a periodic profile the mean width of the profile elements RSm is used. With an RSm between 0.4 and 1.3 mm the following measuring conditions result: λc = 2.5 mm / ln = 12.5 mm / lt = 15 mm / rtip = 5 µm / λs = 8 µm. Periodic profiles e.g. turning, milling RSm (mm) > 0.013 ...0.04 > 0.04 ...0.13 > 0.13 ...0.4 > 0.4 ...1.3 > 1.3 ...4 RSm * If not otherwise specified, the default values are A = 0.5 mm and B = 2.5 mm, respectively. Measurement conditions for Motif paramet A* B* Traverse length (mm) (mm) (mm) 0.02 0.1 0.64 0.1 0.5 3.2 0.5 2.5 16 2.5 12.5 80 Measuring conditions lr sampling length ln evaluation length lt traverse length λc cut-off λs shortwave profile filter rtip stylus tip radius ΔX digitization distance 1) λc = lr (mm) ln (mm) 0.08 0.4 0.25 1.25 0.8 4 2.5 12.5 8 40 Measurement conditions * At Rz ≤ 2 µm the stylus tip radius is 2 µm, at Rz 2 µm it is 5 µm. The distance between two measuring points is ≤ 0.5 µm.
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  ng to ISO4288:1998 and ISO 3274:1998 5 ters according to ISO 12085 Evaluation length λs Maximum stylus tip radius (mm) (µm) (µm) 0.64 2.5 2 ± 0.5 3.2 2.5 2 ± 0.5 16 8 5 ± 1 80 25 10 ± 2 lt (mm) rtip (µm) λs (µm) 0.48 2 2.5 1.5 2 2.5 4.8 2 or 5 * 2.5 15 5 8 48 10 25 1) The digitization distance is also standardized. This is set auto- matically by most roughness measuring instruments. length are defined according to standards. Deviations are necessary if the workpiece does not allow the required traverse length. See drawing entries. Shortened standard evaluation length If the actual possible traverse length on the workpiece surface is not enough for lt, the number of sampling lengths is reduced accordingly and specified in the drawing. If the actually available traverse length is less than a sampling length, the total height of profile Pt of the primary profile is evaluated instead of Rt or Rz. Aperiodic profiles e.g. grinding, eroding Ra (µm) (0.006) …0.02 0.02 …0.1 0.1 …2 2 …10 10 …80 Rz (µm) (0.025) …0.1 0.1 …0.5 0.5 …10 10 …50 50 …200 Rz Measurement conditions
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  6 Rz, Rz1max, Rt accordingto ISO 4287 Surface texture parameters Ra according to ISO 4287 Rz – maximum height of profile Average value of the five Rz values. Rz1max – maximum height of profile Greatest Rz value from the five sampling lengths lr. Rt – total height of profile Rt is the distance between the highest peak and the deepest valley of the profile of the total evaluation length ln. Ra – arithmetical mean deviation Ra is the arithmetic mean roughness value from the amounts of all profile values. Ra does not differentiate between peaks and valleys and has therefore a relatively weak information character. Center line
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  7 Surface texture parameters RPc– standardized number of peaks RPc corresponds to the number of local peaks, which successively exceed an upper section line c1 and a lower section line c2. The number of peaks is related to a length of 10 mm irrespective of the evaluation length selected. RPc according to EN 10049 RSm – mean width of the profile elements RSm is the arithmetic mean value of the width of the roughness profile elements within the sampling length and requires the defi- nition of height discriminations (c1, c2) matching the function of the surface. RSm according to ISO 4287 Center line Center line
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  06/2012·10037109Copyright©HOMMEL-ETAMICGmbH.Allrightsreserved. Our service range Metrology Tactilemetrology Pneumatic metrology Optical metrology Product range Roughness measurement Contour measurement Form measurement Optical shaft measurement Dimensional measurement Optical surface inspection Inspection process In-process Post-process PLC Final inspection Measuring room Service System solutions DAkkS-DKD calibration service Consulting, training and service Our global presence. www.jenoptik.com/metrology
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  Rk, Rpk, Rvk,Mr1, Mr2 according to ISO 13565 Surface texture parameters Rmr(c) according to ISO 4287 Rk – core roughness depth Depth of the roughness core profile. Rpk – reduced peak height Rpk Mean height of the peaks protruding from the roughness profile. Rvk – reduced valley depth Mean depth of the valleys reaching into the material from the core. Mr1, Mr2 – material ratio Smallest and greatest material ratio (in %) at the limits of the roughness core area. Rmr(c) – material ratio of the profile Rmr indicates what ratio the totaled length in the material has assumed relative to the evaluation length (in %). The comparison is made in the specified section height c and the total evaluation length ln. The material ratio curve indicates the material ratio as a function of the section height. 9 Reference line Reference section height c0 Section height c1 Material ratio curve Evaluation length In Material ratio Rmr (c1) Profile peak section Core Profile valley section „Peak surface“ Material ratio „Valley surface“ Material ratio curve
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  Surface texture parameters Motifaccording to ISO 12085 The principle of the Motif standard consists of looking for local peaks and valleys in the primary profile, and associating one valley with the closest preceding and following peaks in order to create a Motif. Several iterative combinations of two Motifs each assure that the most important Motifs, the width of which fall below the limit A, are considered. If not otherwise specified, the default value is A = 0.5 mm (see measurement conditions page 4/5). The limit A has a similar function as the cut-off in the Gaußian filtering. The 16 % rule generally applies. 10 The most important Motif parameters: R – Mean depth of roughness Motifs R is the arithmetic mean value of the depths Hj of the roughness Motifs within the evaluation length. AR – Mean spacing of roughness Motifs AR is the arithmetic mean value of the lengths ARi of the rough- ness Motifs within the evaluation length. Rx – Maximum depth of profile irregularity The deepest depth Hj within the evaluation length. AR1 AR i H 1 H 2 H 3 H j H j+1 Hm-1 Hm AR n
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  WDc Mean value ofthe peaks of the profile elements within the evaluation length. Surface texture parameters WDSm, WDc, WDt – Dominant waviness according to VDA 2007 The primary profile is checked for none, one or two dominant wavinesses. Narrow band filtering of the primary profile with the waviness creates the WD-profile that is used for calculating the parameters. The evaluation length ln is chosen either according to ISO 4288 (as for surface roughness measurements) or on the basis of the drawing entry. Period lengths are checked for dominant wavinesses in the range of 0.02 mm ≤ WDSm ≤ ln/5. To catch dominant wavinesses at WDSm ln/5, it is necessary to enlarge the evaluation length. WDSm Mean horizontal value of the profile elements, calculated from the amplitude spectrum (mean periodic length of the dominant waviness). WDt Vertical difference between the highest and the deepest point of the WD-profile within the evaluation length. 11 P-profile WD-profile WDt WDSm Evaluation length ln Evaluation length ln ∆Z1 ∆Z2 ∆Z3 ∆ZN-1 ∆ZN P-profile WD-profile
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  Evaluation of measurementresults According to ISO 4288 the surface measurement should be made where the highest values are to be expected (visual determination). Maximum value rule The surface is considered good when the measured values of a parame- ter do not exceed the fixed maximum value. In this case, the parameter is identified by the suffix „max“, e.g. Rz1max. 16 % rule If the suffix „max“ is not specified, the 16% rule applies, which states that the surface is considered “good” if not more than 16% of the measured parameter values exceed the fixed maximum value. You will find further information about this rule in the standard ISO 4288:1997. Special rule VDA The 16% rule is not used. VDA 2006 assumes that the dispersion of the parameters is taken into account in the definition of the limit values. The maximum value rule applies generally even without the „max“ index in the designation. The use of the λs filter is prohibited. At Rz ≤ 2 µm the stylus tip radius is 2 µm, at Rz 2 µm it is 5 µm. The distance between two measuring points is ≤ 0.5 µm. The cone angle is either 60° or 90°. If not otherwise specified, the cone angle is 90°. Evaluation 12
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  Drawing entries accordingto ISO 1302:2002 Specifications for requirements a surface parameter with numeric value in µm b second requirement (surface parameter in µm) c production method d specification of valley direction e machining allowance in mm Material removing machining; P-profile, traverse length = 2 mm; Pt = max. 4 µm Material removing machining; transmission characteristic does not comply with standard case (cf. table) Rz = max. 1 µm; filter selection λs = 0.008 mm and λc = 2.5 mm Material removing machining; Rz = max. 4 µm; the maximum value rule applies Material removing machining; upper and lo- wer limit value for Ra demanded; Ra = min. 1 µm and max. 4 µm Material removing machining; lower limit value for Rz demanded; Rz = min. 2.5 µm Material removing machining; Rz = max. 4 µm Drawing entries a d b c e 2/Pt 4 0.008-2.5/Rz1 Rzmax 4 U Ra 4 L Ra 1 L Rz 2.5Rz 4 13
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  Drawing entries accordingto VDA 2005 – dominant waviness Material removing machi- ning; WDc 0 or WDt 0: no dominant waviness allowed Drawing entries Case 1: No dominant waviness allowed Material removing machining; in the period range up to 2.5 mm, WDt = max. 2.5 µm applies Case 2: Dominant wavinesses are allowed up to an upper limit Material removing machining; Rz: the evaluation length is 12.5 mm and λc = 0.8 mm, Rz = max. 3 µm; WDc: in the period range of 0.2 to 2.5 mm, WDc = max. 1.5 µm applies WDc 0 2.5x5/WDt 2.5 0.8x16/Rz 3 0.2-2.5x5/WDc1.5 Case 3: Dominant wavinesses are allowed in a period length with an upper or an upper and lower limit 14