We investigate structure-property relationships in optical materials, aiming to “structurally engineer” new materials for their optoelectronic applications. We use a wide variety of experimental and computational techniques, including X-ray and neutron diffraction, anomalous X-ray scattering, EXAFS, XANES, solid-state NMR, FTIR, inelastic neutron scattering, and density-functional theory modelling.
